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[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Through-Silicon-Via resistive-open defect analysis

Type: Journal Paper

Author : Metzler, C.; Todri, A.; Bosio, A.; Dilillo, L.; Girard, P.; Virazel, A.

Year: 2012

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Globally Constrained Locally Optimized 3-D Power Delivery Networks

Type: Journal Paper

Author : Todri-Sanial, Aida; Kundu, Sandipan; Girard, P.; Bosio, A.; Dilillo, L.; Virazel, A.

Publisher: IEEE

Year: 2014

Dynamic Compact Model of Self-Referenced Magnetic Tunnel Junction

Type: Journal Paper

Author : Azevedo, Joao; Virazel, A.; Bosio, A.; Dilillo, L.; Girard, P.; Alvarez-Herault, Jeremy; Mackay, Ken

Publisher: IEEE

Year: 2014

A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs

Type: Journal Paper

Author : Azevedo, Joao; Virazel, A.; Bosio, A.; Dilillo, L.; Girard, P.; Todri-Sanial, Aida; Alvarez-Herault, Jeremy; Mackay, Ken

Publisher: IEEE

Year: 2014

Determining Realistic Parameters for the <newline/> Double Exponential Law that Models<newline/> Transient Current Pulses

Type: Journal Paper

Author : Wrobel, F.; Dilillo, L.; Touboul, A.D.; Pouget, V.; Saigné , Fré dé ric

Publisher: IEEE

Year: 2014

Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation

Type: Journal Paper

Author : Saoud, T. Saad; Moindjie, S.; Autran, J.L.; Munteanu, Daniela; Wrobel, F.; Saigne, F.; Cocquerez, P.; Dilillo, L.; Glorieux, M.

Publisher: IEEE

Year: 2014

Heavy Ion SEU Cross Section Calculation Based on Proton Experimental Data, and Vice Versa

Type: Journal Paper

Author : Wrobel, F.; Touboul, A.D.; Pouget, V.; Dilillo, L.; Ecoffet, R.; Lorfevre, E.; Bezerra, F.; Brugger, M.; Saigne, F.

Publisher: IEEE

Year: 2014

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

Type: Journal Paper

Author : Tsiligiannis, G.; Dilillo, L.; Bosio, A.; Girard, P.; Pravossoudovitch, S.; Virazel, A.; Cocquerez, P.; Autran, J.L.; Litterio, A.; Wrobel, F.; Saigne, F.

Publisher: IEEE

Year: 2014

Dynamic Test Methods for COTS SRAMs

Type: Journal Paper

Author : Tsiligiannis, G.; Dilillo, L.; Gupta, V.; Bosio, A.; Girard, P.; Virazel, A.; Puchner, H.; Bosser, Alexandre; Javanainen, Arto; Virtanen, Ari; Frost, Christopher; Wrobel, F.; Dusseau, L.; Saigne, F.

Publisher: IEEE

Year: 2014

Gate Voltage Contribution to Neutron-Induced SEB of Trench Gate Fieldstop IGBT

Type: Journal Paper

Author : Foro, L.L.; Touboul, A.D.; Michez, A.; Wrobel, F.; Rech, P.; Dilillo, L.; Frost, Christopher; Saigné , Fré dé ric

Publisher: IEEE

Year: 2014

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[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Through-Silicon-Via resistive-open defect analysis

Globally Constrained Locally Optimized 3-D Power Delivery Networks

Dynamic Compact Model of Self-Referenced Magnetic Tunnel Junction

A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs

Determining Realistic Parameters for the <newline/> Double Exponential Law that Models<newline/> Transient Current Pulses

Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation

Heavy Ion SEU Cross Section Calculation Based on Proton Experimental Data, and Vice Versa

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

Dynamic Test Methods for COTS SRAMs

Gate Voltage Contribution to Neutron-Induced SEB of Trench Gate Fieldstop IGBT

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[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Through-Silicon-Via resistive-open defect analysis

Globally Constrained Locally Optimized 3-D Power Delivery Networks

Dynamic Compact Model of Self-Referenced Magnetic Tunnel Junction

A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs

Determining Realistic Parameters for the <newline/> Double Exponential Law that Models<newline/> Transient Current Pulses

Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation

Heavy Ion SEU Cross Section Calculation Based on Proton Experimental Data, and Vice Versa

90&#x00A0;nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

Dynamic Test Methods for COTS SRAMs

Gate Voltage Contribution to Neutron-Induced SEB of Trench Gate Fieldstop IGBT

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica