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Impacts of NBTI/PBTI on performance of domino logic circuits with high-k metal-gate devices in nanoscale CMOS

Type: Journal Paper

Author : مسعود هوشمند کفاشیان; رضا لطفی; خلیل مافی نژاد; Hamid Mahmoodi; Masaoud Houshmand Kaffashian; Reza Lotfi; Khlil Mafinezhad

Year: 2012

Abstract:

Negative-bias temperature instability (NBTI) and positive-bias temperature instability (PBTI) weaken

PFETs and high-k metal-gate NFETs, respectively. This paper provides comprehensive analyses on the

impacts of NBTI and PBTI on wide...

PBTI-Induced Random Timing Jitter in Circuit-Speed Random Logic

Type: Journal Paper

Author : Jiwu Lu; Jiao, Guangfan; Vaz, C.; Campbell, J.P.; Ryan, J.T.; Cheung, K.P.; Bersuker, Gennadi; Young, Cliff

Publisher: IEEE

Year: 2014

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Impacts of NBTI/PBTI on performance of domino logic circuits with high-k metal-gate devices in nanoscale CMOS

PBTI-Induced Random Timing Jitter in Circuit-Speed Random Logic

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Impacts of NBTI/PBTI on performance of domino logic circuits with high-k metal-gate devices in nanoscale CMOS

PBTI-Induced Random Timing Jitter in Circuit-Speed Random Logic