TSIR: A Chinese Temporal semantics Information Retrieval system based on MapReduce
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: 2014شناسه الکترونیک: 10.1109/ICSICT.2014.7021617
کلیدواژه(گان): etching,masks,photoresists,silicon compounds,CCP etcher,PR strip step,SiO<,sub>,2<,/sub>,cost-effective amorphous silicon hard mask patterning,metal filling,nanoscale contact trench,photoresist,polymer mulation,slightly tapered contact trench,Abstracts,CMOS integrated circuits,Fabrication,FinFETs,Logic gates,Resists,Strips
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TSIR: A Chinese Temporal semantics Information Retrieval system based on MapReduce
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contributor author | Zhongmei Shu , Yayao Zuo , Yong Tang | |
date accessioned | 2020-03-12T20:01:35Z | |
date available | 2020-03-12T20:01:35Z | |
date issued | 2014 | |
identifier other | 6846852.pdf | |
identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/999015 | |
format | general | |
language | English | |
publisher | IEEE | |
title | TSIR: A Chinese Temporal semantics Information Retrieval system based on MapReduce | |
type | Conference Paper | |
contenttype | Metadata Only | |
identifier padid | 8119293 | |
subject keywords | etching | |
subject keywords | masks | |
subject keywords | photoresists | |
subject keywords | silicon compounds | |
subject keywords | CCP etcher | |
subject keywords | PR strip step | |
subject keywords | SiO< | |
subject keywords | sub> | |
subject keywords | 2< | |
subject keywords | /sub> | |
subject keywords | cost-effective amorphous silicon hard mask patterning | |
subject keywords | metal filling | |
subject keywords | nanoscale contact trench | |
subject keywords | photoresist | |
subject keywords | polymer mulation | |
subject keywords | slightly tapered contact trench | |
subject keywords | Abstracts | |
subject keywords | CMOS integrated circuits | |
subject keywords | Fabrication | |
subject keywords | FinFETs | |
subject keywords | Logic gates | |
subject keywords | Resists | |
subject keywords | Strips | |
identifier doi | 10.1109/ICSICT.2014.7021617 | |
journal title | omputer Supported Cooperative Work in Design (CSCWD), Proceedings of the 2014 IEEE 18th Internationa | |
filesize | 398025 | |
citations | 0 |