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Motion Planning of Multi-docking System for Intelligent Mobile Robots

Author:
Su, K.L. , Li, B.Y. , Guo, J.H. , Liao, Y.L.
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/ICSICT.2014.7021291
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/998698
Keyword(s): MOSFET,interface states,semiconductor device models,semiconductor device reliability,BTI stresses,IV measurement,Si-SiO<,sub>,2<,/sub>,interface trap density,n-type interfaces,p-type interfaces,Abstracts,Area measurement,Current measurement,Logic gates,Performance evaluation,Reliability,Substrates
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    Motion Planning of Multi-docking System for Intelligent Mobile Robots

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contributor authorSu, K.L. , Li, B.Y. , Guo, J.H. , Liao, Y.L.
date accessioned2020-03-12T20:01:02Z
date available2020-03-12T20:01:02Z
date issued2014
identifier other6846122.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/998698
formatgeneral
languageEnglish
publisherIEEE
titleMotion Planning of Multi-docking System for Intelligent Mobile Robots
typeConference Paper
contenttypeMetadata Only
identifier padid8118926
subject keywordsMOSFET
subject keywordsinterface states
subject keywordssemiconductor device models
subject keywordssemiconductor device reliability
subject keywordsBTI stresses
subject keywordsIV measurement
subject keywordsSi-SiO<
subject keywordssub>
subject keywords2<
subject keywords/sub>
subject keywordsinterface trap density
subject keywordsn-type interfaces
subject keywordsp-type interfaces
subject keywordsAbstracts
subject keywordsArea measurement
subject keywordsCurrent measurement
subject keywordsLogic gates
subject keywordsPerformance evaluation
subject keywordsReliability
subject keywordsSubstrates
identifier doi10.1109/ICSICT.2014.7021291
journal titleomputer, Consumer and Control (IS3C), 2014 International Symposium on
filesize278806
citations0
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