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Improving efficiency of extensible processors by using approximate custom instructions

date accessioned2020-03-12T19:40:37Z
date available2020-03-12T19:40:37Z
date issued2014
identifier other6800439.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/985836?show=full
formatgeneral
languageEnglish
publisherIEEE
titleImproving efficiency of extensible processors by using approximate custom instructions
typeConference Paper
contenttypeMetadata Only
identifier padid8101543
subject keywordsCMOS memory circuits
subject keywordsSRAM chips
subject keywordsintegrated circuit testing
subject keywordslogic testing
subject keywordsneutron effects
subject keywordsradiation hardening (electronics)
subject keywordsCMOS integrated circuit
subject keywordsdigital logic tests
subject keywordslogic soft errors
subject keywordsneutron irradiation measurements
subject keywordsprocess portable test chip
subject keywordsradiation induced SRAM
subject keywordsradiation induced soft error rate
subject keywordssize 65 nm
subject keywordsvoltage 0.33 V to 1.0 V
subject keywordsCMOS integrated circuits
subject keywordsError analysis
subject keywordsIntegrated circuit modeling
subject keywordsInverters
subject keywordsMarket research
subject keywordsNeutrons
subject keywordsRandom access memory
subject keywordslogic
subject keywordsmemory
subject keywordsne
identifier doi10.1109/CICC.2014.6946138
journal titleesign, Automation and Test in Europe Conference and Exhibition (DATE), 2014
filesize570439
citations1
contributor rawauthorKamal, M. , Ghasemazar, A. , Afzali-Kusha, A. , Pedram, M.


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