Improving efficiency of extensible processors by using approximate custom instructions
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Year
: 2014DOI: 10.1109/CICC.2014.6946138
Keyword(s): CMOS memory circuits,SRAM chips,integrated circuit testing,logic testing,neutron effects,radiation hardening (electronics),CMOS integrated circuit,digital logic tests,logic soft errors,neutron irradiation measurements,process portable test chip,radiation induced SRAM,radiation induced soft error rate,size 65 nm,voltage 0.33 V to 1.0 V,CMOS integrated circuits,Error analysis,Integrated circuit modeling,Inverters,Market research,Neutrons,Random access memory,logic,memory,ne
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Improving efficiency of extensible processors by using approximate custom instructions
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| date accessioned | 2020-03-12T19:40:37Z | |
| date available | 2020-03-12T19:40:37Z | |
| date issued | 2014 | |
| identifier other | 6800439.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/985836?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Improving efficiency of extensible processors by using approximate custom instructions | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8101543 | |
| subject keywords | CMOS memory circuits | |
| subject keywords | SRAM chips | |
| subject keywords | integrated circuit testing | |
| subject keywords | logic testing | |
| subject keywords | neutron effects | |
| subject keywords | radiation hardening (electronics) | |
| subject keywords | CMOS integrated circuit | |
| subject keywords | digital logic tests | |
| subject keywords | logic soft errors | |
| subject keywords | neutron irradiation measurements | |
| subject keywords | process portable test chip | |
| subject keywords | radiation induced SRAM | |
| subject keywords | radiation induced soft error rate | |
| subject keywords | size 65 nm | |
| subject keywords | voltage 0.33 V to 1.0 V | |
| subject keywords | CMOS integrated circuits | |
| subject keywords | Error analysis | |
| subject keywords | Integrated circuit modeling | |
| subject keywords | Inverters | |
| subject keywords | Market research | |
| subject keywords | Neutrons | |
| subject keywords | Random access memory | |
| subject keywords | logic | |
| subject keywords | memory | |
| subject keywords | ne | |
| identifier doi | 10.1109/CICC.2014.6946138 | |
| journal title | esign, Automation and Test in Europe Conference and Exhibition (DATE), 2014 | |
| filesize | 570439 | |
| citations | 1 | |
| contributor rawauthor | Kamal, M. , Ghasemazar, A. , Afzali-Kusha, A. , Pedram, M. |