•  English
    • Persian
    • English
  •   Login
  • Ferdowsi University of Mashhad
  • |
  • Information Center and Central Library
    • Persian
    • English
  • Home
  • Source Types
    • Journal Paper
    • Ebook
    • Conference Paper
    • Standard
    • Protocol
    • Thesis
  • Use Help
View Item 
  •   FUM Digital Library
  • Fum
  • Articles
  • Latin Articles
  • View Item
  •   FUM Digital Library
  • Fum
  • Articles
  • Latin Articles
  • View Item
  • All Fields
  • Title
  • Author
  • Year
  • Publisher
  • Subject
  • Publication Title
  • ISSN
  • DOI
  • ISBN
Advanced Search
JavaScript is disabled for your browser. Some features of this site may not work without it.

3.7 kV Vertical GaN PN Diodes

Author:
Kizilyalli, Isik C.
,
Edwards, Andrew P.
,
Nie, Hui
,
Bour, David
,
Prunty, Thomas
,
Disney, Don
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/LED.2013.2294175
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/964098
Keyword(s): MOCVD,avalanche breakdown,gallium compounds,power semiconductor diodes,semiconductor device measurement,semiconductor growth,wide band gap semiconductors,GaN,MOCVD,area differential specific on resistance,breakdown voltages,bulk substrates,low defect density,power electronics application,vertical GaN PN diodes,voltage 3.7 kV,wide band gap semiconductor devices,Gallium nitride,Schottky diodes,Silicon,Silicon carbide,Substrates,Gallium nitride,avalanche breakdown,power diod
Collections :
  • Latin Articles
  • Show Full MetaData Hide Full MetaData
  • Statistics

    3.7 kV Vertical GaN PN Diodes

Show full item record

contributor authorKizilyalli, Isik C.
contributor authorEdwards, Andrew P.
contributor authorNie, Hui
contributor authorBour, David
contributor authorPrunty, Thomas
contributor authorDisney, Don
date accessioned2020-03-12T18:36:22Z
date available2020-03-12T18:36:22Z
date issued2014
identifier issn0741-3106
identifier other6684571.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/964098
formatgeneral
languageEnglish
publisherIEEE
title3.7 kV Vertical GaN PN Diodes
typeJournal Paper
contenttypeMetadata Only
identifier padid7997544
subject keywordsMOCVD
subject keywordsavalanche breakdown
subject keywordsgallium compounds
subject keywordspower semiconductor diodes
subject keywordssemiconductor device measurement
subject keywordssemiconductor growth
subject keywordswide band gap semiconductors
subject keywordsGaN
subject keywordsMOCVD
subject keywordsarea differential specific on resistance
subject keywordsbreakdown voltages
subject keywordsbulk substrates
subject keywordslow defect density
subject keywordspower electronics application
subject keywordsvertical GaN PN diodes
subject keywordsvoltage 3.7 kV
subject keywordswide band gap semiconductor devices
subject keywordsGallium nitride
subject keywordsSchottky diodes
subject keywordsSilicon
subject keywordsSilicon carbide
subject keywordsSubstrates
subject keywordsGallium nitride
subject keywordsavalanche breakdown
subject keywordspower diod
identifier doi10.1109/LED.2013.2294175
journal titleElectron Device Letters, IEEE
journal volume35
journal issue2
filesize1110679
citations0
  • About Us
نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
DSpace software copyright © 2019-2022  DuraSpace