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Transitioning to Physics-of-Failure as a Reliability Driver in Power Electronics

contributor authorHuai Wang
contributor authorLiserre, Marco
contributor authorBlaabjerg, Frede
contributor authorde Place Rimmen, Peter
contributor authorJacobsen, John Bjerregaard
contributor authorKvisgaard, Thorkild
contributor authorLandkildehus, Jorn
date accessioned2020-03-12T18:32:39Z
date available2020-03-12T18:32:39Z
date issued2014
identifier issn2168-6777
identifier other6661372.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/962004?show=full
formatgeneral
languageEnglish
publisherIEEE
titleTransitioning to Physics-of-Failure as a Reliability Driver in Power Electronics
typeJournal Paper
contenttypeMetadata Only
identifier padid7994901
subject keywordscondition monitoring
subject keywordsfailure analysis
subject keywordsinsulated gate bipolar transistors
subject keywordspower semiconductor devices
subject keywordssemiconductor device reliability
subject keywordscondition monitoring
subject keywordsinsulated gate bipolar transistor modules
subject keywordsintelligent control
subject keywordsmultidisciplinary research
subject keywordsphysics-of-failure analysis
subject keywordspower electronics reliability
subject keywordsreliability research
subject keywordsrobustness validation
subject keywordsFailure analysis
subject keywordsInsulated gate bipolar transistors
subject keywordsReliability engineering
subject keywordsRobustness
subject keywordsStress
subject keywordsCapacitors
subject keywordsdesign for reliability (DFR)
subject keywordsi
identifier doi10.1109/JESTPE.2013.2290282
journal titleEmerging and Selected Topics in Power Electronics, IEEE Journal of
journal volume2
journal issue1
filesize5285709
citations0


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