Transitioning to Physics-of-Failure as a Reliability Driver in Power Electronics
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: 2014شناسه الکترونیک: 10.1109/JESTPE.2013.2290282
کلیدواژه(گان): condition monitoring,failure analysis,insulated gate bipolar transistors,power semiconductor devices,semiconductor device reliability,condition monitoring,insulated gate bipolar transistor modules,intelligent control,multidisciplinary research,physics-of-failure analysis,power electronics reliability,reliability research,robustness validation,Failure analysis,Insulated gate bipolar transistors,Reliability engineering,Robustness,Stress,Capacitors,design for reliability (DFR),i
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Transitioning to Physics-of-Failure as a Reliability Driver in Power Electronics
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| contributor author | Huai Wang | |
| contributor author | Liserre, Marco | |
| contributor author | Blaabjerg, Frede | |
| contributor author | de Place Rimmen, Peter | |
| contributor author | Jacobsen, John Bjerregaard | |
| contributor author | Kvisgaard, Thorkild | |
| contributor author | Landkildehus, Jorn | |
| date accessioned | 2020-03-12T18:32:39Z | |
| date available | 2020-03-12T18:32:39Z | |
| date issued | 2014 | |
| identifier issn | 2168-6777 | |
| identifier other | 6661372.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/962004 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Transitioning to Physics-of-Failure as a Reliability Driver in Power Electronics | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 7994901 | |
| subject keywords | condition monitoring | |
| subject keywords | failure analysis | |
| subject keywords | insulated gate bipolar transistors | |
| subject keywords | power semiconductor devices | |
| subject keywords | semiconductor device reliability | |
| subject keywords | condition monitoring | |
| subject keywords | insulated gate bipolar transistor modules | |
| subject keywords | intelligent control | |
| subject keywords | multidisciplinary research | |
| subject keywords | physics-of-failure analysis | |
| subject keywords | power electronics reliability | |
| subject keywords | reliability research | |
| subject keywords | robustness validation | |
| subject keywords | Failure analysis | |
| subject keywords | Insulated gate bipolar transistors | |
| subject keywords | Reliability engineering | |
| subject keywords | Robustness | |
| subject keywords | Stress | |
| subject keywords | Capacitors | |
| subject keywords | design for reliability (DFR) | |
| subject keywords | i | |
| identifier doi | 10.1109/JESTPE.2013.2290282 | |
| journal title | Emerging and Selected Topics in Power Electronics, IEEE Journal of | |
| journal volume | 2 | |
| journal issue | 1 | |
| filesize | 5285709 | |
| citations | 0 |