Effect of Grain Size and Distribution on the Shielding Effectiveness of Transparent Conducting Thin Films
Author:
, , , , ,Publisher:
Year
: 2014DOI: 10.1109/TEMC.2013.2282085
Keyword(s): electrical engineering computing,electromagnetic shielding,nanotechnology,scanning electron microscopes,software tools,sputter deposition,statistical distributions,thin films,transparency,film surface grains,fitting models,high radio frequency shielding effectiveness,magnetron sputtering,nanostructured thin films,scanning electron microscope,statistical distributions,transparent conducting thin film,Frequency measurement,Grain size,Optical films,Optical imaging,Substrates,S
Collections
:
-
Statistics
Effect of Grain Size and Distribution on the Shielding Effectiveness of Transparent Conducting Thin Films
Show full item record
| contributor author | Lampasi, Domenico Alessandro | |
| contributor author | Tamburrano, Alessio | |
| contributor author | Bellini, Sandro | |
| contributor author | Tului, Mario | |
| contributor author | Albolino, Augusto | |
| contributor author | Sarto, M.S. | |
| date accessioned | 2020-03-12T18:30:31Z | |
| date available | 2020-03-12T18:30:31Z | |
| date issued | 2014 | |
| identifier issn | 0018-9375 | |
| identifier other | 6642087.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/960848 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Effect of Grain Size and Distribution on the Shielding Effectiveness of Transparent Conducting Thin Films | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 7993555 | |
| subject keywords | electrical engineering computing | |
| subject keywords | electromagnetic shielding | |
| subject keywords | nanotechnology | |
| subject keywords | scanning electron microscopes | |
| subject keywords | software tools | |
| subject keywords | sputter deposition | |
| subject keywords | statistical distributions | |
| subject keywords | thin films | |
| subject keywords | transparency | |
| subject keywords | film surface grains | |
| subject keywords | fitting models | |
| subject keywords | high radio frequency shielding effectiveness | |
| subject keywords | magnetron sputtering | |
| subject keywords | nanostructured thin films | |
| subject keywords | scanning electron microscope | |
| subject keywords | statistical distributions | |
| subject keywords | transparent conducting thin film | |
| subject keywords | Frequency measurement | |
| subject keywords | Grain size | |
| subject keywords | Optical films | |
| subject keywords | Optical imaging | |
| subject keywords | Substrates | |
| subject keywords | S | |
| identifier doi | 10.1109/TEMC.2013.2282085 | |
| journal title | Electromagnetic Compatibility, IEEE Transactions on | |
| journal volume | 56 | |
| journal issue | 2 | |
| filesize | 1174671 | |
| citations | 0 |