Effect of Grain Size and Distribution on the Shielding Effectiveness of Transparent Conducting Thin Films
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Year
: 2014DOI: 10.1109/TEMC.2013.2282085
Keyword(s): electrical engineering computing,electromagnetic shielding,nanotechnology,scanning electron microscopes,software tools,sputter deposition,statistical distributions,thin films,transparency,film surface grains,fitting models,high radio frequency shielding effectiveness,magnetron sputtering,nanostructured thin films,scanning electron microscope,statistical distributions,transparent conducting thin film,Frequency measurement,Grain size,Optical films,Optical imaging,Substrates,S
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Effect of Grain Size and Distribution on the Shielding Effectiveness of Transparent Conducting Thin Films
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| contributor author | Lampasi, Domenico Alessandro | |
| contributor author | Tamburrano, Alessio | |
| contributor author | Bellini, Sandro | |
| contributor author | Tului, Mario | |
| contributor author | Albolino, Augusto | |
| contributor author | Sarto, M.S. | |
| date accessioned | 2020-03-12T18:30:31Z | |
| date available | 2020-03-12T18:30:31Z | |
| date issued | 2014 | |
| identifier issn | 0018-9375 | |
| identifier other | 6642087.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/960848?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Effect of Grain Size and Distribution on the Shielding Effectiveness of Transparent Conducting Thin Films | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 7993555 | |
| subject keywords | electrical engineering computing | |
| subject keywords | electromagnetic shielding | |
| subject keywords | nanotechnology | |
| subject keywords | scanning electron microscopes | |
| subject keywords | software tools | |
| subject keywords | sputter deposition | |
| subject keywords | statistical distributions | |
| subject keywords | thin films | |
| subject keywords | transparency | |
| subject keywords | film surface grains | |
| subject keywords | fitting models | |
| subject keywords | high radio frequency shielding effectiveness | |
| subject keywords | magnetron sputtering | |
| subject keywords | nanostructured thin films | |
| subject keywords | scanning electron microscope | |
| subject keywords | statistical distributions | |
| subject keywords | transparent conducting thin film | |
| subject keywords | Frequency measurement | |
| subject keywords | Grain size | |
| subject keywords | Optical films | |
| subject keywords | Optical imaging | |
| subject keywords | Substrates | |
| subject keywords | S | |
| identifier doi | 10.1109/TEMC.2013.2282085 | |
| journal title | Electromagnetic Compatibility, IEEE Transactions on | |
| journal volume | 56 | |
| journal issue | 2 | |
| filesize | 1174671 | |
| citations | 0 |