Mechanical Property Measurement of Carbon Infiltrated Carbon Nanotube Structures for Compliant Micromechanisms
نویسنده:
, , , , , , ,ناشر:
سال
: 2014شناسه الکترونیک: 10.1109/JMEMS.2014.2312847
کلیدواژه(گان): Young',s modulus,bending,cantilevers,carbon nanotubes,chemical vapour deposition,micromechanical devices,stress relaxation,3-point bending tests,CNT,MEMS applications,Young',s modulus,cantilever beam samples,carbon nanotubes,chemical vapor deposition,dense lithographically patterned forests,failure strain,failure stress,framework structures,microelectromechanical systems applications,rectangular beams,solid structures,stress relaxation,transverse direction,vertical
کالکشن
:
-
آمار بازدید
Mechanical Property Measurement of Carbon Infiltrated Carbon Nanotube Structures for Compliant Micromechanisms
Show full item record
| contributor author | Hanna, B.H. | |
| contributor author | Fazio, W.C. | |
| contributor author | Tanner, J.D. | |
| contributor author | Lund, J.M. | |
| contributor author | Wood, T.S. | |
| contributor author | Davis, R.C. | |
| contributor author | Vanfleet, R.R. | |
| contributor author | Jensen, B.D. | |
| date accessioned | 2020-03-12T23:56:47Z | |
| date available | 2020-03-12T23:56:47Z | |
| date issued | 2014 | |
| identifier issn | 1057-7157 | |
| identifier other | 6784315.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1128976 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Mechanical Property Measurement of Carbon Infiltrated Carbon Nanotube Structures for Compliant Micromechanisms | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8309254 | |
| subject keywords | Young' | |
| subject keywords | s modulus | |
| subject keywords | bending | |
| subject keywords | cantilevers | |
| subject keywords | carbon nanotubes | |
| subject keywords | chemical vapour deposition | |
| subject keywords | micromechanical devices | |
| subject keywords | stress relaxation | |
| subject keywords | 3-point bending tests | |
| subject keywords | CNT | |
| subject keywords | MEMS applications | |
| subject keywords | Young' | |
| subject keywords | s modulus | |
| subject keywords | cantilever beam samples | |
| subject keywords | carbon nanotubes | |
| subject keywords | chemical vapor deposition | |
| subject keywords | dense lithographically patterned forests | |
| subject keywords | failure strain | |
| subject keywords | failure stress | |
| subject keywords | framework structures | |
| subject keywords | microelectromechanical systems applications | |
| subject keywords | rectangular beams | |
| subject keywords | solid structures | |
| subject keywords | stress relaxation | |
| subject keywords | transverse direction | |
| subject keywords | vertical | |
| identifier doi | 10.1109/JMEMS.2014.2312847 | |
| journal title | Microelectromechanical Systems, Journal of | |
| journal volume | 23 | |
| journal issue | 6 | |
| filesize | 5473717 | |
| citations | 0 |