Measurement of the Intrinsic Parameters of Single-Mode VCSELs
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سال
: 2014شناسه الکترونیک: 10.1109/JLT.2014.2308303
کلیدواژه(گان): carrier lifetime,laser cavity resonators,laser modes,laser noise,laser variables measurement,semiconductor lasers,surface emitting lasers,Intensity noise spectrum analysis,bias current,differential carrier lifetime,high resolution CW optical spectrum measurements,intrinsic parameter measurement,laser linewidth,laser power,long-wavelength vertical-cavity surface-emitting laser,parameter extraction,semiconductor laser rate equations,single-transverse mode VCSEL,wavelength 1550 nm
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آمار بازدید
Measurement of the Intrinsic Parameters of Single-Mode VCSELs
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contributor author | Perez, Pablo | |
contributor author | Valle, Angel | |
contributor author | Noriega, Ignacio | |
contributor author | Pesquera, Luis | |
date accessioned | 2020-03-12T23:48:29Z | |
date available | 2020-03-12T23:48:29Z | |
date issued | 2014 | |
identifier issn | 0733-8724 | |
identifier other | 6747990.pdf | |
identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1124065 | |
format | general | |
language | English | |
publisher | IEEE | |
title | Measurement of the Intrinsic Parameters of Single-Mode VCSELs | |
type | Journal Paper | |
contenttype | Metadata Only | |
identifier padid | 8303581 | |
subject keywords | carrier lifetime | |
subject keywords | laser cavity resonators | |
subject keywords | laser modes | |
subject keywords | laser noise | |
subject keywords | laser variables measurement | |
subject keywords | semiconductor lasers | |
subject keywords | surface emitting lasers | |
subject keywords | Intensity noise spectrum analysis | |
subject keywords | bias current | |
subject keywords | differential carrier lifetime | |
subject keywords | high resolution CW optical spectrum measurements | |
subject keywords | intrinsic parameter measurement | |
subject keywords | laser linewidth | |
subject keywords | laser power | |
subject keywords | long-wavelength vertical-cavity surface-emitting laser | |
subject keywords | parameter extraction | |
subject keywords | semiconductor laser rate equations | |
subject keywords | single-transverse mode VCSEL | |
subject keywords | wavelength 1550 nm | |
identifier doi | 10.1109/JLT.2014.2308303 | |
journal title | Lightwave Technology, Journal of | |
journal volume | 32 | |
journal issue | 8 | |
filesize | 416239 | |
citations | 0 |