Establishment of RF attenuation standard in the frequency range of 30 GHz to 50 GHz at NMIJ
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: 2014DOI: 10.1109/APEDE.2014.6958273
Keyword(s): Aluminum,Chemical vapor deposition,Degradation,Materials,Metallization,Microelectronics,Reliability
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Establishment of RF attenuation standard in the frequency range of 30 GHz to 50 GHz at NMIJ
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contributor author | Widarta, Anton , Katou, Yuuto | |
date accessioned | 2020-03-12T23:33:11Z | |
date available | 2020-03-12T23:33:11Z | |
date issued | 2014 | |
identifier other | 6898474.pdf | |
identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1115783?locale-attribute=en | |
format | general | |
language | English | |
publisher | IEEE | |
title | Establishment of RF attenuation standard in the frequency range of 30 GHz to 50 GHz at NMIJ | |
type | Conference Paper | |
contenttype | Metadata Only | |
identifier padid | 8285276 | |
subject keywords | Aluminum | |
subject keywords | Chemical vapor deposition | |
subject keywords | Degradation | |
subject keywords | Materials | |
subject keywords | Metallization | |
subject keywords | Microelectronics | |
subject keywords | Reliability | |
identifier doi | 10.1109/APEDE.2014.6958273 | |
journal title | recision Electromagnetic Measurements (CPEM 2014), 2014 Conference on | |
filesize | 382922 | |
citations | 0 |