Fatigue life prediction for solder interconnects in IGBT modules by using the successive initiation method
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: 2014شناسه الکترونیک: 10.1109/ISSREW.2014.80
کلیدواژه(گان): Cloud computing,Contracts,Law,Outsourcing,Risk management,Security,Cloud,Outsourcing,Risk Assessment,Risk Management,Security
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Fatigue life prediction for solder interconnects in IGBT modules by using the successive initiation method
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date accessioned | 2020-03-12T23:26:44Z | |
date available | 2020-03-12T23:26:44Z | |
date issued | 2014 | |
identifier other | 6892335.pdf | |
identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1111877 | |
format | general | |
language | English | |
publisher | IEEE | |
title | Fatigue life prediction for solder interconnects in IGBT modules by using the successive initiation method | |
type | Conference Paper | |
contenttype | Metadata Only | |
identifier padid | 8280744 | |
subject keywords | Cloud computing | |
subject keywords | Contracts | |
subject keywords | Law | |
subject keywords | Outsourcing | |
subject keywords | Risk management | |
subject keywords | Security | |
subject keywords | Cloud | |
subject keywords | Outsourcing | |
subject keywords | Risk Assessment | |
subject keywords | Risk Management | |
subject keywords | Security | |
identifier doi | 10.1109/ISSREW.2014.80 | |
journal title | hermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2014 IEEE Intersociety Confere | |
filesize | 567504 | |
citations | 0 | |
contributor rawauthor | Ghodke, N. , Kumbhakarna, D. , Nakanekar, S. , Tonapi, S. |