Estimation of the number of crop seeds based on image identification
ناشر:
سال
: 2014شناسه الکترونیک: 10.1109/ECTC.2014.6897352
کلیدواژه(گان): catalysts,n integrated circuit manufacture,n sputter etching,n three-dimensional integrated circuits,n MaCE,n TSV fabrications,n catalyst geometry,n catalyst morphology,n high-speed wet etching method,n metal-assisted chemical etching,n sub-micron scale TSV etching,n through silicon vias,n Annealing,n Etching,n Gold,n Silicon,n Substrates
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آمار بازدید
Estimation of the number of crop seeds based on image identification
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contributor author | Li Pengfei | |
contributor author | Meng Qi | |
contributor author | Zhang Weihong | |
date accessioned | 2020-03-12T22:37:48Z | |
date available | 2020-03-12T22:37:48Z | |
date issued | 2014 | |
identifier other | 7017204.pdf | |
identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1089296 | |
format | general | |
language | English | |
publisher | IEEE | |
title | Estimation of the number of crop seeds based on image identification | |
type | Conference Paper | |
contenttype | Metadata Only | |
identifier padid | 8227485 | |
subject keywords | catalysts | |
subject keywords | n integrated circuit manufacture | |
subject keywords | n sputter etching | |
subject keywords | n three-dimensional integrated circuits | |
subject keywords | n MaCE | |
subject keywords | n TSV fabrications | |
subject keywords | n catalyst geometry | |
subject keywords | n catalyst morphology | |
subject keywords | n high-speed wet etching method | |
subject keywords | n metal-assisted chemical etching | |
subject keywords | n sub-micron scale TSV etching | |
subject keywords | n through silicon vias | |
subject keywords | n Annealing | |
subject keywords | n Etching | |
subject keywords | n Gold | |
subject keywords | n Silicon | |
subject keywords | n Substrates | |
identifier doi | 10.1109/ECTC.2014.6897352 | |
journal title | omputing, Communications and IT Applications Conference (ComComAp), 2014 IEEE | |
filesize | 521761 | |
citations | 0 |