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Estimation of the number of crop seeds based on image identification

Author:
Li Pengfei
,
Meng Qi
,
Zhang Weihong
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/ECTC.2014.6897352
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/1089296
Keyword(s): catalysts,n integrated circuit manufacture,n sputter etching,n three-dimensional integrated circuits,n MaCE,n TSV fabrications,n catalyst geometry,n catalyst morphology,n high-speed wet etching method,n metal-assisted chemical etching,n sub-micron scale TSV etching,n through silicon vias,n Annealing,n Etching,n Gold,n Silicon,n Substrates
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    Estimation of the number of crop seeds based on image identification

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contributor authorLi Pengfei
contributor authorMeng Qi
contributor authorZhang Weihong
date accessioned2020-03-12T22:37:48Z
date available2020-03-12T22:37:48Z
date issued2014
identifier other7017204.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1089296?locale-attribute=en
formatgeneral
languageEnglish
publisherIEEE
titleEstimation of the number of crop seeds based on image identification
typeConference Paper
contenttypeMetadata Only
identifier padid8227485
subject keywordscatalysts
subject keywordsn integrated circuit manufacture
subject keywordsn sputter etching
subject keywordsn three-dimensional integrated circuits
subject keywordsn MaCE
subject keywordsn TSV fabrications
subject keywordsn catalyst geometry
subject keywordsn catalyst morphology
subject keywordsn high-speed wet etching method
subject keywordsn metal-assisted chemical etching
subject keywordsn sub-micron scale TSV etching
subject keywordsn through silicon vias
subject keywordsn Annealing
subject keywordsn Etching
subject keywordsn Gold
subject keywordsn Silicon
subject keywordsn Substrates
identifier doi10.1109/ECTC.2014.6897352
journal titleomputing, Communications and IT Applications Conference (ComComAp), 2014 IEEE
filesize521761
citations0
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