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Transformer leakage flux models for electromagnetic transients: Critical review and validation of a new model

contributor authorLambert, M.
contributor authorMartinez, M.
contributor authorMahseredjian, J.
contributor authorde Leon, F.
contributor authorSirois, F.
date accessioned2020-03-12T21:22:45Z
date available2020-03-12T21:22:45Z
date issued2014
identifier other6939321.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1046967?show=full
formatgeneral
languageEnglish
publisherIEEE
titleTransformer leakage flux models for electromagnetic transients: Critical review and validation of a new model
typeConference Paper
contenttypeMetadata Only
identifier padid8175959
subject keywordsBandwidth
subject keywordsComputer network reliability
subject keywordsDelays
subject keywordsJitter
subject keywordsMultiprotocol label switching
subject keywordsQuality of service
subject keywordsReliability
identifier doi10.1109/GLOCOM.2014.7037097
journal titleES General Meeting | Conference & Exposition, 2014 IEEE
filesize88430
citations0


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