Transformer leakage flux models for electromagnetic transients: Critical review and validation of a new model
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: 2014DOI: 10.1109/GLOCOM.2014.7037097
Keyword(s): Bandwidth,Computer network reliability,Delays,Jitter,Multiprotocol label switching,Quality of service,Reliability
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Transformer leakage flux models for electromagnetic transients: Critical review and validation of a new model
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| contributor author | Lambert, M. | |
| contributor author | Martinez, M. | |
| contributor author | Mahseredjian, J. | |
| contributor author | de Leon, F. | |
| contributor author | Sirois, F. | |
| date accessioned | 2020-03-12T21:22:45Z | |
| date available | 2020-03-12T21:22:45Z | |
| date issued | 2014 | |
| identifier other | 6939321.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1046967 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Transformer leakage flux models for electromagnetic transients: Critical review and validation of a new model | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8175959 | |
| subject keywords | Bandwidth | |
| subject keywords | Computer network reliability | |
| subject keywords | Delays | |
| subject keywords | Jitter | |
| subject keywords | Multiprotocol label switching | |
| subject keywords | Quality of service | |
| subject keywords | Reliability | |
| identifier doi | 10.1109/GLOCOM.2014.7037097 | |
| journal title | ES General Meeting | Conference & Exposition, 2014 IEEE | |
| filesize | 88430 | |
| citations | 0 |