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Increased contact resistance of switching contacts during current carrying

contributor authorWeis, Martin , Johler, Werner
date accessioned2020-03-12T20:12:23Z
date available2020-03-12T20:12:23Z
date issued2014
identifier other6857138.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1005840?show=full
formatgeneral
languageEnglish
publisherIEEE
titleIncreased contact resistance of switching contacts during current carrying
typeConference Paper
contenttypeMetadata Only
identifier padid8127313
subject keywordsfinite element analysis
subject keywordsphotoelasticity
subject keywordsstress analysis
subject keywordsthree-dimensional integrated circuits
subject keywordsMIPE system
subject keywordsTSV residual stress
subject keywordsfinite element method
subject keywordsmaximum principal stress
subject keywordsmicroinfrared photoelasticity system
subject keywordssilicon chip
subject keywordsstress distribution
subject keywordsstress information
subject keywordsFilling
subject keywordsFinite element analysis
subject keywordsResidual stresses
subject keywordsSilicon
subject keywordsThrough-silicon vias
subject keywordsFinite element method
subject keywordsPhoto-elasticity
subject keywordsStress
subject keywordsThrough Silicon Via (TSV)
identifier doi10.1109/ICEPT.2014.6922843
journal titleCEC 2014; The 27th International Conference on Electrical Contacts; Proceedings of
filesize478350
citations0


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