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Extracting model parameters from thermal transient measurements for thermal stress simulation

Type: Conference Paper

Author : Sarkany, Zoltan; Rencz, Marta

Publisher: IEEE

Year: 2014

Comparison of different power cycling strategies for accelerated lifetime testing of power devices

Type: Conference Paper

Author : Sarkany, Zoltan; Vass-Varnai, Andras; Rencz, Marta

Publisher: IEEE

Year: 2014

Separation of failure modes in short cycle time power cycling experiments

Type: Conference Paper

Author : Sarkany, Zoltan; Vass-Varnai, Andras; Rencz, Marta

Publisher: IEEE

Year: 2014

In situ thermal reliability testing methodology for novel thermal interface materials

Type: Conference Paper

Author : Hantos, Gusztav; Juhasz, Laszlo; Rencz, Marta

Publisher: IEEE

Year: 2014

Analysis of concurrent failure mechanisms in IGBT structures during active power cycling tests

Type: Conference Paper

Author : Sarkany, Zoltan; Vass-Varnai, Andras; Rencz, Marta

Publisher: IEEE

Year: 2014

Author

Rencz, Marta (5)

Sarkany, Zoltan (4)

Vass-Varnai, Andras (3)

Hantos, Gusztav (1)

Juhasz, Laszlo (1)

Publisher

IEEE (5)

Year

2014 (5)

Keywords

Algorithm design and analysis (1)

integrated circuit packaging (1)

Internet (1)

n AI (1)

n application characterization (1)

n application performance diagnosis (1)

n application tuning cycle (1)

n Approximation methods (1)

n artificial intelligence (1)

n Ball tracking (1)

Type

Conference Paper (5)

Language (ISO)

English (5)

Content Type

Metadata Only (5)

Publication Title

hermal Investigations of ICs and Systems (THERMINIC), 2014 20th International Workshop on (3)

lectronics Packaging Technology Conference (EPTC), 2014 IEEE 16th (1)

lectronics System-Integration Technology Conference (ESTC), 2014 (1)

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