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[IEEE 2010 8th IEEE International NEWCAS Conference (NEWCAS) - Montreal, QC, Canada (2010.06.20-2010.06.23)] Proceedings of the 8th IEEE International NEWCAS Conference 2010 - A simple fault-tolerant digital voter circuit in TMR nanoarchitectures

Type: Journal Paper

Author : Ban, Tian; de Barros Naviner, Lirida Alves

Year: 2010

Signal probability for reliability evaluation of logic circuits

Type: Journal Paper

Author : Franco, Denis Teixeira; Vasconcelos, Maí Correia; Naviner, Lirida; Naviner, Jean-François

Publisher: Elsevier Science

Year: 2008

Battery-aware network discovery algorithm for mobile terminals within heterogeneous networks

Type: Conference Paper

Author : Pons, Xavier; Althunibat, Saud; Kibalya, Godfrey; Gruet, Christophe; Naviner, Lirida; Granelli, Fabrizio

Publisher: IEEE

Year: 2014

[IEEE 2008 15th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2008) - St. Julien\'s, Malta (2008.08.31-2008.09.3)] 2008 15th IEEE International Conference on Electronics, Circuits and Systems - Reliability analysis of logic circuits based on signal probability

Type: Journal Paper

Author : Franco, Denis Teixeira; Correia Vasconcelos, Mai; Naviner, Lirida; Naviner, Jean-Francois

Year: 2008

Author

Naviner, Lirida (3)

Franco, Denis Teixeira (2)

Althunibat, Saud (1)

Ban, Tian (1)

Correia Vasconcelos, Mai (1)

de Barros Naviner, Lirida Alves (1)

Granelli, Fabrizio (1)

Gruet, Christophe (1)

Kibalya, Godfrey (1)

Naviner, Jean-Francois (1)

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IEEE (1)

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2010 (1)

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Cloud computing (1)

n Cloud computing case study (1)

n Cloud computing security (1)

n Computational modeling (1)

n Information security (1)

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n Servers (1)

n Software as a service (1)

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Microelectronics Reliability (1)

omputer Aided Modeling and Design of Communication Links and Networks (CAMAD), 2014 IEEE 19th Intern (1)

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