Signal probability for reliability evaluation of logic circuits
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Year
: 2008DOI: 10.1016/j.microrel.2008.07.002
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Signal probability for reliability evaluation of logic circuits
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| contributor author | Franco, Denis Teixeira | |
| contributor author | Vasconcelos, Maí Correia | |
| contributor author | Naviner, Lirida | |
| contributor author | Naviner, Jean-François | |
| date accessioned | 2020-03-12T00:25:10Z | |
| date available | 2020-03-12T00:25:10Z | |
| date issued | 2008 | |
| identifier other | sbfBrQk6BHsTizWw0URDkYb_hGIgkTyTiBxU9x4fmsOJLnC9kG.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/692666 | |
| format | general | |
| language | English | |
| publisher | Elsevier Science | |
| title | Signal probability for reliability evaluation of logic circuits | |
| type | Journal Paper | |
| contenttype | Fulltext | |
| contenttype | Fulltext | |
| identifier padid | 5263608 | |
| identifier doi | 10.1016/j.microrel.2008.07.002 | |
| journal title | Microelectronics Reliability | |
| coverage | Academic | |
| pages | 1586-1591 | |
| journal volume | 48 | |
| journal issue | 8 | |
| filesize | 284650 | |
| citations | 1 |