Search

نمایش تعداد 1-5 از 5

Shortest path reduction in a class of uniform fault tolerant networks

نوع: Conference Paper

نویسنده : Joshi, Prashant D.; Hamdioui, Said

ناشر: IEEE

سال: 2014

Layout-Based Refined NPSF Model for DRAM Characterization and Testing

نوع: Journal Paper

نویسنده : Sfikas, Yiorgos; Tsiatouhas, Yiorgos E.; Hamdioui, Said

ناشر: IEEE

سال: 2014

Region Disjoint Paths in a Class of Optimal Line Graph Networks

نوع: Conference Paper

نویسنده : Joshi, Prashant D.; Sen, Arunabha; Hamdioui, Said; Bertels, Koen

ناشر: IEEE

سال: 2014

Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface

نوع: Conference Paper

نویسنده : Marinissen, Erik Jan; De Wachter, Bart; Smith, Ken; Kiesewetter, Jorg; Taouil, Mottaqiallah; Hamdioui, Said

ناشر: IEEE

سال: 2014

Comparison of Reaction-Diffusion and Atomistic Trap-Based BTI Models for Logic Gates

نوع: Journal Paper

نویسنده : Kukner, Halil; Khan, Sharifullah; Weckx, Pieter; Raghavan, Praveen; Hamdioui, Said; Kaczer, Ben; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido

ناشر: IEEE

سال: 2014

Search

Shortest path reduction in a class of uniform fault tolerant networks

Layout-Based Refined NPSF Model for DRAM Characterization and Testing

Region Disjoint Paths in a Class of Optimal Line Graph Networks

Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface

Comparison of Reaction-Diffusion and Atomistic Trap-Based BTI Models for Logic Gates

نویسنده

ناشر

سال

کلیدواژه

نوع

زبان

نوع محتوا

عنوان ناشر

Search

Filters

Shortest path reduction in a class of uniform fault tolerant networks

Layout-Based Refined NPSF Model for DRAM Characterization and Testing

Region Disjoint Paths in a Class of Optimal Line Graph Networks

Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface

Comparison of Reaction-Diffusion and Atomistic Trap-Based BTI Models for Logic Gates