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A warp speed method for conducting Monte Carlo experiments involving bootstrap estimators
Publisher: Cambridge University Press
Year: 2013
Gate misalignment evaluation method for commercial MOS trapezoidal gate transistors
Publisher: IEEE
Year: 2014
Temperature and back-gate bias influence on the operation of lateral SOI PIN photodiodes
Publisher: IEEE
Year: 2014
Transitory recovery time of bio-potential amplifiers that include CMOS pseudo-resistors
Publisher: IEEE
Year: 2014
First Successful SEE Measurements with Heavy Ions in Brazil
Publisher: IEEE
Year: 2014