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    Re-evaluating chain-code as features for Bangla script 

    Type: Conference Paper
    Author : Alam, M.N. , Naser, M.A.
    Publisher: IEEE
    Year: 2014

    A Music Emotion Recognition Algorithm with Hierarchical SVM Based Classifiers 

    Type: Conference Paper
    Author : Wei-Chun Chiang , Jeen-Shing Wang , Yu-Liang Hsu
    Publisher: IEEE
    Year: 2014

    Enhancing Locality via Caching in the GMU Protocol 

    Type: Conference Paper
    Author : Pimentel, H. , Romano, P. , Peluso, S. , Ruivo, P.
    Publisher: IEEE
    Year: 2014

    hatS: A Heterogeneity-Aware Tiered Storage for Hadoop 

    Type: Conference Paper
    Author : Krish, K.R. , Anwar, A. , Butt, A.R.
    Publisher: IEEE
    Year: 2014

    Smart dynamic sampling for wafer at risk reduction in semiconductor manufacturing 

    Type: Conference Paper
    Author : Housseman, S.; Dauzere-Peres, S.; Rodriguez-Verjan, G.; Pinaton, J.
    Publisher: IEEE
    Year: 2014

    Packet delivery significance and metrics improvements in protocols for 3-D routing in Wireless Sensor Networks 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Understanding the importance of administrative compliance 

    Type: Conference Paper
    Author : Wainwright, N.
    Publisher: IEEE
    Year: 2014

    Statistical Fluctuations in HfO<sub><italic><bold>x</bold></italic></sub> Resistive-Switching Memory: Part I - Set/Reset Variability 

    Type: Journal Paper
    Author : Ambrogio, Stefano; Balatti, S.; Cubeta, A.; Calderoni, Alessandro; Ramaswamy, Nirmal; Ielmini, Daniele
    Publisher: IEEE
    Year: 2014

    Time-Dependent 3-D Statistical KMC Simulation of Reliability in Nanoscale MOSFETs 

    Type: Journal Paper
    Author : Amoroso, Salvatore Maria; Gerrer, Louis; Hussin, R.; Adamu-Lema, F.; Asenov, Asen
    Publisher: IEEE
    Year: 2014

    Interplay Between Statistical Variability and Reliability in Contemporary pMOSFETs: Measurements Versus Simulations 

    Type: Journal Paper
    Author : Hussin, R.; Amoroso, Salvatore Maria; Gerrer, Louis; Kaczer, Ben; Weckx, Pieter; Franco, Jacopo; Vanderheyden, A.; Vanhaeren, D.; Horiguchi, Naoto; Asenov, Asen
    Publisher: IEEE
    Year: 2014
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