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Now showing items 1-10 of 76

Precisely timed IEMI fault injection synchronized with EM information leakage

Type: Conference Paper

Author : Hayashi, Yu-ichi; Homma, Naofumi; Mizuki, Takaaki; Aoki, Takafumi; Sone, Hideaki

Publisher: IEEE

Year: 2014

New equivalent stress describes the dicing caused anisotropic breaking strength of silicon dies

Type: Conference Paper

Author : Steiert, M. , Wilde, J.

Publisher: IEEE

Year: 2014

Performance improvement in mesh-based optical networks-on-chip

Type: Conference Paper

Publisher: IEEE

Year: 2014

Transformer leakage flux models for electromagnetic transients: Critical review and validation of a new model

Type: Conference Paper

Author : Lambert, M.; Martinez, M.; Mahseredjian, J.; de Leon, F.; Sirois, F.

Publisher: IEEE

Year: 2014

Impact of DFIG with phase lock loop dynamics on power systems small signal stability

Type: Conference Paper

Author : Zhiwen Wang; Chen Shen; Feng Liu

Publisher: IEEE

Year: 2014

Assessment of voltage stability risks under intermittent renewable generation

Type: Conference Paper

Author : Alpcan, T.; Saha, S.; Aldeen, M.

Publisher: IEEE

Year: 2014

Wireless 100 Gb/s: PHY layer overview and challenges in the THz freqency band

Type: Conference Paper

Publisher: IEEE

Year: 2014

Security by Design for the Smart Grid: Combining the SGAM and NISTIR 7628

Type: Conference Paper

Author : Uslar, M. , Rosinger, C. , Schlegel, S.

Publisher: IEEE

Year: 2014

Integrity assessment scheme for situational awareness in utility automation systems

Type: Conference Paper

Author : Mohagheghi, S.

Publisher: IEEE

Year: 2014

2012: The actors of innovation in the Province of Quebec, Canada

Type: Conference Paper

Author : Lain, G.C.; Dorion, E.C.H.; Prodanov, C.C.; Coallier, F.; Olea, P.M.

Publisher: IEEE

Year: 2014

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Precisely timed IEMI fault injection synchronized with EM information leakage

New equivalent stress describes the dicing caused anisotropic breaking strength of silicon dies

Performance improvement in mesh-based optical networks-on-chip

Transformer leakage flux models for electromagnetic transients: Critical review and validation of a new model

Impact of DFIG with phase lock loop dynamics on power systems small signal stability

Assessment of voltage stability risks under intermittent renewable generation

Wireless 100 Gb/s: PHY layer overview and challenges in the THz freqency band

Security by Design for the Smart Grid: Combining the SGAM and NISTIR 7628

Integrity assessment scheme for situational awareness in utility automation systems

2012: The actors of innovation in the Province of Quebec, Canada

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Precisely timed IEMI fault injection synchronized with EM information leakage

New equivalent stress describes the dicing caused anisotropic breaking strength of silicon dies

Performance improvement in mesh-based optical networks-on-chip

Transformer leakage flux models for electromagnetic transients: Critical review and validation of a new model

Impact of DFIG with phase lock loop dynamics on power systems small signal stability

Assessment of voltage stability risks under intermittent renewable generation

Wireless 100 Gb/s: PHY layer overview and challenges in the THz freqency band

Security by Design for the Smart Grid: Combining the SGAM and NISTIR 7628

Integrity assessment scheme for situational awareness in utility automation systems

2012: The actors of innovation in the Province of Quebec, Canada