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نمایش تعداد 1-3 از 3
Test Compaction by Sharing of Transparent-Scan Sequences Among Logic Blocks
ناشر: IEEE
سال: 2014
Reducing the input test data volume under transparent scan
ناشر: IET
سال: 2014
Performance Evaluation of an IaaS Opportunistic Cloud Computing
ناشر: IEEE
سال: 2014