Performance Evaluation of an IaaS Opportunistic Cloud Computing
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سال
: 2014شناسه الکترونیک: 10.1109/ICSICT.2014.7021435
کلیدواژه(گان): automatic test equipment,combinational circuits,flip-flops,logic design,radiation hardening (electronics),redundancy,sequential circuits,20-fold reduction,ATE,BISER flip-flop design technique,IC chips,RH-SFF,SER,advanced technology,area improvement,automatic test equipment,built-in soft error resilience,circuit simulations,combinational logic,power efficient improvement,radiation hardened scan flip-flop design,radiation-induced soft errors,scan clock,sequential element,si
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آمار بازدید
Performance Evaluation of an IaaS Opportunistic Cloud Computing
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| date accessioned | 2020-03-12T20:01:16Z | |
| date available | 2020-03-12T20:01:16Z | |
| date issued | 2014 | |
| identifier other | 6846495.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/998837 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Performance Evaluation of an IaaS Opportunistic Cloud Computing | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8119083 | |
| subject keywords | automatic test equipment | |
| subject keywords | combinational circuits | |
| subject keywords | flip-flops | |
| subject keywords | logic design | |
| subject keywords | radiation hardening (electronics) | |
| subject keywords | redundancy | |
| subject keywords | sequential circuits | |
| subject keywords | 20-fold reduction | |
| subject keywords | ATE | |
| subject keywords | BISER flip-flop design technique | |
| subject keywords | IC chips | |
| subject keywords | RH-SFF | |
| subject keywords | SER | |
| subject keywords | advanced technology | |
| subject keywords | area improvement | |
| subject keywords | automatic test equipment | |
| subject keywords | built-in soft error resilience | |
| subject keywords | circuit simulations | |
| subject keywords | combinational logic | |
| subject keywords | power efficient improvement | |
| subject keywords | radiation hardened scan flip-flop design | |
| subject keywords | radiation-induced soft errors | |
| subject keywords | scan clock | |
| subject keywords | sequential element | |
| subject keywords | si | |
| identifier doi | 10.1109/ICSICT.2014.7021435 | |
| journal title | luster, Cloud and Grid Computing (CCGrid), 2014 14th IEEE/ACM International Symposium on | |
| filesize | 196520 | |
| citations | 1 | |
| contributor rawauthor | Diaz, C.O. , Pecero, J.E. , Bouvry, P. , Sotelo, G. , Villamizar, M. , Castro, H. |