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Now showing items 1-7 of 7
Towards a Generic Representation of Heavy Ion Tracks to be Used in Engineering SEE Simulation Tools
Publisher: IEEE
Year: 2014
Influence of Transfer Gate Design and Bias on the Radiation Hardness of Pinned Photodiode CMOS Image Sensors
Publisher: IEEE
Year: 2014
Total Ionizing Dose Effects Mitigation Strategy for Nanoscaled FDSOI Technologies
Publisher: IEEE
Year: 2014
Ion-Induced Charge-Collection Transients in p-Channel AlGaSb/InGaSb Heterojunction Field-Effect Transistors
Publisher: IEEE
Year: 2014
Proton Irradiation Response of Hole-Assisted Carbon Coated Erbium-Doped Fiber Amplifiers
Publisher: IEEE
Year: 2014