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Effect of back gate on parasitic bipolar effect in FD SOI MOSFETs

Type: Conference Paper

Author : Liu, Fanyu; Ionica, Irina; Bawedin, Maryline; Cristoloveanu, Sorin

Publisher: IEEE

Year: 2014

Thin-body ESD protections in 28nm UTBB-FDSOI: From static to transient behavior

Type: Conference Paper

Author : Solaro, Yohann; Fonteneau, Pascal; Legrand, Charles-Alexandre; Marin-Cudraz, David; Passieux, Jeremy; Guyader, Pascal; Clement, Laurent-Renaud; Fenouillet-Beranger, Claire; Ferrari, Philippe; Cristoloveanu, Sorin

Publisher: IEEE

Year: 2014

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Effect of back gate on parasitic bipolar effect in FD SOI MOSFETs

Thin-body ESD protections in 28nm UTBB-FDSOI: From static to transient behavior

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Effect of back gate on parasitic bipolar effect in FD SOI MOSFETs

Thin-body ESD protections in 28nm UTBB-FDSOI: From static to transient behavior