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Evaluation of Enhanced Low Dose Rate Sensitivity in Fourth-Generation SiGe HBTs
Publisher: IEEE
Year: 2014
Influence of Transfer Gate Design and Bias on the Radiation Hardness of Pinned Photodiode CMOS Image Sensors
Publisher: IEEE
Year: 2014
Geometry Dependence of Total-Dose Effects in Bulk FinFETs
Publisher: IEEE
Year: 2014
Total-Ionizing-Dose Response of Narrow, Long Channel 45 nm PDSOI Transistors
Publisher: IEEE
Year: 2014
TID Radiation Response of 3-D Vertical GAA SONOS Memory Cells
Publisher: IEEE
Year: 2014