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Test Compaction by Sharing of Transparent-Scan Sequences Among Logic Blocks

Type: Journal Paper

Author : Pomeranz, Irith

Publisher: IEEE

Year: 2014

Reducing the input test data volume under transparent scan

Type: Journal Paper

Author : Pomeranz, Irith

Publisher: IET

Year: 2014

Performance Evaluation of an IaaS Opportunistic Cloud Computing

Type: Conference Paper

Publisher: IEEE

Year: 2014

Author

Pomeranz, Irith (2)

Publisher

IEEE (2)

IET (1)

Year

2014 (3)

Keywords

logic testing (2)

sequential circuits (2)

test compaction (2)

transparent scan (2)

20-fold reduction (1)

advanced technology (1)

area improvement (1)

ATE (1)

automatic test equipment (1)

BISER flip-flop design technique (1)

Type

Journal Paper (2)

Conference Paper (1)

Language (ISO)

English (3)

Content Type

Metadata Only (3)

Publication Title

Computers &amp; Digital Techniques, IET (1)

luster, Cloud and Grid Computing (CCGrid), 2014 14th IEEE/ACM International Symposium on (1)

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on (1)

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