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Now showing items 1-7 of 7

Recent improvements in the global satellite mapping of precipitation (GSMaP)

Type: Conference Paper

Author : Kachi, M.; Kubota, T.; Aonashi, K.; Ushio, T.; Shige, S.; Yamamoto, M.; Mega, T.; Oki, R.

Publisher: IEEE

Year: 2014

Queuing strategies for self overload control in SIP servers

Type: Conference Paper

Author : Guduru, K.K.; Usha, J.

Publisher: IEEE

Year: 2014

Workflow Management for Real-Time Analysis of Lightsource Experiments

Type: Conference Paper

Author : Deslippe, J.; Essiari, A.; Patton, S.J.; Samak, T.; Tull, C.E.; Hexemer, A.; Kumar, D.; Parkinson, D.; Stewart, P.

Publisher: IEEE

Year: 2014

Accident of automobile due to lightning

Type: Conference Paper

Author : Yamamoto, Kazuo; Naito, Yuta; Yanagawa, Shunichi; Takahashi, Naoto; Matsui, Michihiro

Publisher: IEEE

Year: 2014

A flat panel detector

Type: Conference Paper

Author : Panpan Zhang; Yan Tu; Lanlan Yang; Tolner, H.; Wei Zhang

Publisher: IEEE

Year: 2014

PCDS: A new approach for the development of circuit generators in analog IC design

Type: Conference Paper

Author : Marolt, D.; Greif, M.; Scheible, J.; Jerke, G.

Publisher: IEEE

Year: 2014

Variation behavior of tunnel-FETs originated from dopant concentration at source region and channel edge configuration

Type: Conference Paper

Publisher: IEEE

Year: 2014

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Recent improvements in the global satellite mapping of precipitation (GSMaP)

Queuing strategies for self overload control in SIP servers

Workflow Management for Real-Time Analysis of Lightsource Experiments

Accident of automobile due to lightning

A flat panel detector

PCDS: A new approach for the development of circuit generators in analog IC design

Variation behavior of tunnel-FETs originated from dopant concentration at source region and channel edge configuration

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Recent improvements in the global satellite mapping of precipitation (GSMaP)

Queuing strategies for self overload control in SIP servers

Workflow Management for Real-Time Analysis of Lightsource Experiments

Accident of automobile due to lightning

A flat panel detector

PCDS: A new approach for the development of circuit generators in analog IC design

Variation behavior of tunnel-FETs originated from dopant concentration at source region and channel edge configuration