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Single Event Hard Errors in SRAM Under Heavy Ion Irradiation

Type: Journal Paper

Author : Haran, Avner; Barak, Joseph; David, David; Keren, Eitan; Refaeli, Nati; Rapaport, Shimshon

Publisher: IEEE

Year: 2014

Microdose Induced Drain Leakage Effects in Power Trench MOSFETs: Experiment and Modeling

Type: Journal Paper

Author : Zebrev, Gennady /I/.; Vatuev, Alexander S.; Useinov, Rustem G.; Emeliyanov, Vladimir V.; Anashin, Vasily S.; Gorbunov, Maxim S.; Turin, Valentin O.; Yesenkov, Kirill /A/.

Publisher: IEEE

Year: 2014

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Single Event Hard Errors in SRAM Under Heavy Ion Irradiation

Microdose Induced Drain Leakage Effects in Power Trench MOSFETs: Experiment and Modeling

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Single Event Hard Errors in SRAM Under Heavy Ion Irradiation

Microdose Induced Drain Leakage Effects in Power Trench MOSFETs: Experiment and Modeling