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Performance optimization of PVM based parallel applications using optimal number of slaves

Type: Conference Paper

Publisher: IEEE

Year: 2014

Profiling of Channel-Hot-Carrier Stress-Induced Trap Distributions Along Channel and Gate Dielectric in High-<formula formulatype="inline"> <img src="/images/tex/348.gif" alt="k"> </formula> Gated MOSFETs by a Modified Charge Pumping Technique

Type: Journal Paper

Author : Chun-Chang Lu; Kuei-Shu Chang-Liao; Che-Hao Tsao; Tien-Ko Wang; Hsueh-Chao Ko; Yao-Tung Hsu

Publisher: IEEE

Year: 2014

Total Ionizing Dose Effects on DRAM Data Retention Time

Type: Journal Paper

Author : Bacchini, Angelo; Furano, Gianluca; Rovatti, Marco; Ottavi, Marco

Publisher: IEEE

Year: 2014

Author

Bacchini, Angelo (1)

Che-Hao Tsao (1)

Chun-Chang Lu (1)

Furano, Gianluca (1)

Hsueh-Chao Ko (1)

Kuei-Shu Chang-Liao (1)

Ottavi, Marco (1)

Rovatti, Marco (1)

Tien-Ko Wang (1)

Yao-Tung Hsu (1)

Publisher

IEEE (3)

Year

2014 (3)

Keywords

interface states (2)

leakage currents (2)

3D TCAD simulation (1)

6T-SRAM cell read and write operation (1)

bias temperature instability (1)

channel hot carrier induced reliability (1)

channel hot carrier stress induced trap distributions (1)

charge pumping technique (1)

CHC stress-induced interface trap generation (1)

Computational modeling (1)

Type

Journal Paper (2)

Conference Paper (1)

Language (ISO)

English (3)

Content Type

Metadata Only (3)

Publication Title

Electron Devices, IEEE Transactions on (1)

Nuclear Science, IEEE Transactions on (1)

ptimization, Reliabilty, and Information Technology (ICROIT), 2014 International Conference on (1)

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