Performance optimization of PVM based parallel applications using optimal number of slaves
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سال
: 2014شناسه الکترونیک: 10.1109/SBMicro.2014.6940078
کلیدواژه(گان): SRAM chips,interface states,stochastic processes,technology CAD (electronics),3D TCAD simulation,6T-SRAM cell read and write operation,RD model,bias temperature instability,device-level variability simulation,interface trap generation,pre-existing bulk trap charging,simple exponential impact assumption,small area device,stochastic BTl modeling,stochastic reaction diffusion model,threshold voltage generation,threshold voltage shift distribution,Computational modeling,Integrated
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Performance optimization of PVM based parallel applications using optimal number of slaves
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| date accessioned | 2020-03-12T19:38:54Z | |
| date available | 2020-03-12T19:38:54Z | |
| date issued | 2014 | |
| identifier other | 6798360.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/984838 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Performance optimization of PVM based parallel applications using optimal number of slaves | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8100358 | |
| subject keywords | SRAM chips | |
| subject keywords | interface states | |
| subject keywords | stochastic processes | |
| subject keywords | technology CAD (electronics) | |
| subject keywords | 3D TCAD simulation | |
| subject keywords | 6T-SRAM cell read and write operation | |
| subject keywords | RD model | |
| subject keywords | bias temperature instability | |
| subject keywords | device-level variability simulation | |
| subject keywords | interface trap generation | |
| subject keywords | pre-existing bulk trap charging | |
| subject keywords | simple exponential impact assumption | |
| subject keywords | small area device | |
| subject keywords | stochastic BTl modeling | |
| subject keywords | stochastic reaction diffusion model | |
| subject keywords | threshold voltage generation | |
| subject keywords | threshold voltage shift distribution | |
| subject keywords | Computational modeling | |
| subject keywords | Integrated | |
| identifier doi | 10.1109/SBMicro.2014.6940078 | |
| journal title | ptimization, Reliabilty, and Information Technology (ICROIT), 2014 International Conference on | |
| filesize | 2045375 | |
| citations | 0 | |
| contributor rawauthor | Sampath, S. , Nanjesh, B.R. , Sagar, B.B. , Subbaraya, C.K. |