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Now showing items 1-4 of 4
High-Sensitivity Charge-Transfer-Type pH Sensor With Quasi-Signal Removal Structure
Publisher: IEEE
Year: 2014
Determination of In Situ Trap Properties in CCDs Using a “Single-Trap Pumping” Technique
Publisher: IEEE
Year: 2014
Influence of Transfer Gate Design and Bias on the Radiation Hardness of Pinned Photodiode CMOS Image Sensors
Publisher: IEEE
Year: 2014
Proton Damage Comparison of an e2v Technologies n-channel and p-channel CCD204
Publisher: IEEE
Year: 2014