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Profiling of Channel-Hot-Carrier Stress-Induced Trap Distributions Along Channel and Gate Dielectric in High-<formula formulatype="inline"> <img src="/images/tex/348.gif" alt="k"> </formula> Gated MOSFETs by a Modified Charge Pumping Technique

Type: Journal Paper

Author : Chun-Chang Lu; Kuei-Shu Chang-Liao; Che-Hao Tsao; Tien-Ko Wang; Hsueh-Chao Ko; Yao-Tung Hsu

Publisher: IEEE

Year: 2014

Mapping Algorithms Optimizing the Overall Manhattan Distance for Pre-Occupied Cluster Computers in SLA-Based Grid Environments

Type: Conference Paper

Author : Linnert, B. , Schneider, J. , Burchard, L.-O.

Publisher: IEEE

Year: 2014

Radio-Frequency Characterization of Selectively Regrown InGaAs Lateral Nanowire MOSFETs

Type: Journal Paper

Author : Zota, C.B.; Roll, G.; Wernersson, L.-E.; Lind, E.

Publisher: IEEE

Year: 2014

Border Traps in InGaAs nMOSFETs Assessed by Low-Frequency Noise

Type: Journal Paper

Author : Scarpino, Mercedes; Gupta, Swastik; Lin, Dongyang; Alian, A.; Crupi, Felice; Collaert, Nadine; Thean, A.; Simoen, Eddy

Publisher: IEEE

Year: 2014

Author

Alian, A. (1)

Che-Hao Tsao (1)

Chun-Chang Lu (1)

Collaert, Nadine (1)

Crupi, Felice (1)

Gupta, Swastik (1)

Hsueh-Chao Ko (1)

Kuei-Shu Chang-Liao (1)

Lin, Dongyang (1)

Lind, E. (1)

Publisher

IEEE (4)

Year

2014 (4)

Keywords

gallium arsenide (3)

III-V semiconductors (3)

indium compounds (3)

InGaAs (3)

MOSFET (3)

/sub&gt (2)

2&lt (2)

3&lt (2)

Al&lt (2)

alumina (2)

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Journal Paper (3)

Conference Paper (1)

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English (4)

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Metadata Only (4)

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Electron Devices, IEEE Transactions on (2)

Electron Device Letters, IEEE (1)

luster, Cloud and Grid Computing (CCGrid), 2014 14th IEEE/ACM International Symposium on (1)

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