| date accessioned | 2020-03-12T20:01:16Z |  | 
| date available | 2020-03-12T20:01:16Z |  | 
| date issued | 2014 |  | 
| identifier other | 6846495.pdf |  | 
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/998837?locale-attribute=fa&show=full |  | 
| format | general |  | 
| language | English |  | 
| publisher | IEEE |  | 
| title | Performance Evaluation of an IaaS Opportunistic Cloud Computing |  | 
| type | Conference Paper |  | 
| contenttype | Metadata Only |  | 
| identifier padid | 8119083 |  | 
| subject keywords | automatic test equipment |  | 
| subject keywords | combinational circuits |  | 
| subject keywords | flip-flops |  | 
| subject keywords | logic design |  | 
| subject keywords | radiation hardening (electronics) |  | 
| subject keywords | redundancy |  | 
| subject keywords | sequential circuits |  | 
| subject keywords | 20-fold reduction |  | 
| subject keywords | ATE |  | 
| subject keywords | BISER flip-flop design technique |  | 
| subject keywords | IC chips |  | 
| subject keywords | RH-SFF |  | 
| subject keywords | SER |  | 
| subject keywords | advanced technology |  | 
| subject keywords | area improvement |  | 
| subject keywords | automatic test equipment |  | 
| subject keywords | built-in soft error resilience |  | 
| subject keywords | circuit simulations |  | 
| subject keywords | combinational logic |  | 
| subject keywords | power efficient improvement |  | 
| subject keywords | radiation hardened scan flip-flop design |  | 
| subject keywords | radiation-induced soft errors |  | 
| subject keywords | scan clock |  | 
| subject keywords | sequential element |  | 
| subject keywords | si |  | 
| identifier doi | 10.1109/ICSICT.2014.7021435 |  | 
| journal title | luster, Cloud and Grid Computing (CCGrid), 2014 14th IEEE/ACM International Symposium on |  | 
| filesize | 196520 |  | 
| citations | 1 |  | 
| contributor rawauthor | Diaz, C.O. , Pecero, J.E. , Bouvry, P. , Sotelo, G. , Villamizar, M. , Castro, H. |  |