Positioning and Navigation of Meal Delivery Robot Using Magnetic Sensors and RFID
Author:
Publisher:
Year
: 2014DOI: 10.1109/ICSICT.2014.7021175
Keyword(s): atomic force microscopy,crystallisation,dielectric materials,elemental semiconductors,nanostructured materials,semiconductor-insulator boundaries,silicon,silicon compounds,AFM,EFM,KPFM,Kelvin probe force microscopy,KrF excimer laser crystallization technique,Si,SiC-Si-SiC-Si,amorphous silicon carbide,areal charge densities,atomic force microscopy,charge injection,charging effect,electric field analysis,electrostatic force microscopy,microscopic,scanning probe techniques,s
Collections
:
-
Statistics
Positioning and Navigation of Meal Delivery Robot Using Magnetic Sensors and RFID
Show full item record
| contributor author | Yan-An Lu , Guo-Shing Huang | |
| date accessioned | 2020-03-12T20:00:50Z | |
| date available | 2020-03-12T20:00:50Z | |
| date issued | 2014 | |
| identifier other | 6846006.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/998582 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Positioning and Navigation of Meal Delivery Robot Using Magnetic Sensors and RFID | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8118801 | |
| subject keywords | atomic force microscopy | |
| subject keywords | crystallisation | |
| subject keywords | dielectric materials | |
| subject keywords | elemental semiconductors | |
| subject keywords | nanostructured materials | |
| subject keywords | semiconductor-insulator boundaries | |
| subject keywords | silicon | |
| subject keywords | silicon compounds | |
| subject keywords | AFM | |
| subject keywords | EFM | |
| subject keywords | KPFM | |
| subject keywords | Kelvin probe force microscopy | |
| subject keywords | KrF excimer laser crystallization technique | |
| subject keywords | Si | |
| subject keywords | SiC-Si-SiC-Si | |
| subject keywords | amorphous silicon carbide | |
| subject keywords | areal charge densities | |
| subject keywords | atomic force microscopy | |
| subject keywords | charge injection | |
| subject keywords | charging effect | |
| subject keywords | electric field analysis | |
| subject keywords | electrostatic force microscopy | |
| subject keywords | microscopic | |
| subject keywords | scanning probe techniques | |
| subject keywords | s | |
| identifier doi | 10.1109/ICSICT.2014.7021175 | |
| journal title | omputer, Consumer and Control (IS3C), 2014 International Symposium on | |
| filesize | 626045 | |
| citations | 0 |