Modeling cache coherence misses on multicores
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: 2014DOI: 10.1109/ICCDCS.2014.7016147
Keyword(s): MOSFET,random-access storage,1 transistor floating body dynamic random access memory application,1T-FBRAM application,AC measurements,DC measurements,FBE,alternating current measurements,biristor,bulk contact,charge storage,direct current measurements,floating body effect,junction capacitor,real memory operation,triple gate n-channel bulk FinFET,Current measurement,FinFETs,Hysteresis,Junctions,Logic gates,Random access memory,Bulk,FinFET,back bias,floating body effect,m
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Modeling cache coherence misses on multicores
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| contributor author | Xiaoyue Pan , Jonsson, B. | |
| date accessioned | 2020-03-12T19:59:05Z | |
| date available | 2020-03-12T19:59:05Z | |
| date issued | 2014 | |
| identifier other | 6844465.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/997552?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Modeling cache coherence misses on multicores | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8117526 | |
| subject keywords | MOSFET | |
| subject keywords | random-access storage | |
| subject keywords | 1 transistor floating body dynamic random access memory application | |
| subject keywords | 1T-FBRAM application | |
| subject keywords | AC measurements | |
| subject keywords | DC measurements | |
| subject keywords | FBE | |
| subject keywords | alternating current measurements | |
| subject keywords | biristor | |
| subject keywords | bulk contact | |
| subject keywords | charge storage | |
| subject keywords | direct current measurements | |
| subject keywords | floating body effect | |
| subject keywords | junction capacitor | |
| subject keywords | real memory operation | |
| subject keywords | triple gate n-channel bulk FinFET | |
| subject keywords | Current measurement | |
| subject keywords | FinFETs | |
| subject keywords | Hysteresis | |
| subject keywords | Junctions | |
| subject keywords | Logic gates | |
| subject keywords | Random access memory | |
| subject keywords | Bulk | |
| subject keywords | FinFET | |
| subject keywords | back bias | |
| subject keywords | floating body effect | |
| subject keywords | m | |
| identifier doi | 10.1109/ICCDCS.2014.7016147 | |
| journal title | erformance Analysis of Systems and Software (ISPASS), 2014 IEEE International Symposium on | |
| filesize | 373829 | |
| citations | 2 |