Linear diversity analysis for QAM in Rician fading channels
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: 2014DOI: 10.1109/EEEI.2014.7005898
Keyword(s): Electron mobility,Logic gates,MOSFET,Resistance,Temperature,Temperature measurement,Threshold voltage,Nanoscale FD-SOI MOSFET,TCAD,Y-function,mobility,series resistance
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Linear diversity analysis for QAM in Rician fading channels
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| contributor author | Jonqyin Sun | |
| date accessioned | 2020-03-12T19:55:32Z | |
| date available | 2020-03-12T19:55:32Z | |
| date issued | 2014 | |
| identifier other | 6839960.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/995372 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Linear diversity analysis for QAM in Rician fading channels | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8114896 | |
| subject keywords | Electron mobility | |
| subject keywords | Logic gates | |
| subject keywords | MOSFET | |
| subject keywords | Resistance | |
| subject keywords | Temperature | |
| subject keywords | Temperature measurement | |
| subject keywords | Threshold voltage | |
| subject keywords | Nanoscale FD-SOI MOSFET | |
| subject keywords | TCAD | |
| subject keywords | Y-function | |
| subject keywords | mobility | |
| subject keywords | series resistance | |
| identifier doi | 10.1109/EEEI.2014.7005898 | |
| journal title | ireless and Optical Communication Conference (WOCC), 2014 23rd | |
| filesize | 341621 | |
| citations | 0 |