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Cavity formation in bonded silicon wafers using partially cured dry etch bisbenzocyclobutene (BCB)

Author:
Bakhtazad, A. , Manwar, R. , Chowdhury, S.
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/ISSOC.2014.6972434
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/990124
Keyword(s): Message systems,Topology
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    Cavity formation in bonded silicon wafers using partially cured dry etch bisbenzocyclobutene (BCB)

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contributor authorBakhtazad, A. , Manwar, R. , Chowdhury, S.
date accessioned2020-03-12T19:47:18Z
date available2020-03-12T19:47:18Z
date issued2014
identifier other6820298.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/990124?locale-attribute=en
formatgeneral
languageEnglish
publisherIEEE
titleCavity formation in bonded silicon wafers using partially cured dry etch bisbenzocyclobutene (BCB)
typeConference Paper
contenttypeMetadata Only
identifier padid8106532
subject keywordsMessage systems
subject keywordsTopology
identifier doi10.1109/ISSOC.2014.6972434
journal titleircuits and Systems (LASCAS), 2014 IEEE 5th Latin American Symposium on
filesize1368067
citations0
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