An adaptive Memory Interface Controller for improving bandwidth utilization of hybrid and reconfigurable systems
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سال
: 2014شناسه الکترونیک: 10.1109/CICC.2014.6946092
کلیدواژه(گان): MOSFET,SRAM chips,logic circuits,oscillators,process monitoring,semiconductor device testing,NMOS,SOC designs,SRAM read current variability,body bias based process corner correction,corner skew lots,die as-fabricated process corners,digital circuits,digital outputs,embedded microprocessors,integrated blocks,logic circuits,logic ring oscillators,on-die PMOS,parametric yield correction,power correction,process monitors,size 55 nm,Current measurement,Delays,MOS devices,Mir
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An adaptive Memory Interface Controller for improving bandwidth utilization of hybrid and reconfigurable systems
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| contributor author | Castellana, V.G. , Tumeo, A. , Ferrandi, F. | |
| date accessioned | 2020-03-12T19:40:33Z | |
| date available | 2020-03-12T19:40:33Z | |
| date issued | 2014 | |
| identifier other | 6800393.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/985792?locale-attribute=fa | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | An adaptive Memory Interface Controller for improving bandwidth utilization of hybrid and reconfigurable systems | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8101490 | |
| subject keywords | MOSFET | |
| subject keywords | SRAM chips | |
| subject keywords | logic circuits | |
| subject keywords | oscillators | |
| subject keywords | process monitoring | |
| subject keywords | semiconductor device testing | |
| subject keywords | NMOS | |
| subject keywords | SOC designs | |
| subject keywords | SRAM read current variability | |
| subject keywords | body bias based process corner correction | |
| subject keywords | corner skew lots | |
| subject keywords | die as-fabricated process corners | |
| subject keywords | digital circuits | |
| subject keywords | digital outputs | |
| subject keywords | embedded microprocessors | |
| subject keywords | integrated blocks | |
| subject keywords | logic circuits | |
| subject keywords | logic ring oscillators | |
| subject keywords | on-die PMOS | |
| subject keywords | parametric yield correction | |
| subject keywords | power correction | |
| subject keywords | process monitors | |
| subject keywords | size 55 nm | |
| subject keywords | Current measurement | |
| subject keywords | Delays | |
| subject keywords | MOS devices | |
| subject keywords | Mir | |
| identifier doi | 10.1109/CICC.2014.6946092 | |
| journal title | esign, Automation and Test in Europe Conference and Exhibition (DATE), 2014 | |
| filesize | 227751 | |
| citations | 0 |