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When Common Knowledge Becomes Common Doubt -- Modeling IT-Induced Ambiguities about the Strategic Situation as Reasons for Flash Crashes

contributor authorBrandt, T. , Neumann, D.
date accessioned2020-03-12T19:32:26Z
date available2020-03-12T19:32:26Z
date issued2014
identifier other6758752.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/981133?locale-attribute=en&show=full
formatgeneral
languageEnglish
publisherIEEE
titleWhen Common Knowledge Becomes Common Doubt -- Modeling IT-Induced Ambiguities about the Strategic Situation as Reasons for Flash Crashes
typeConference Paper
contenttypeMetadata Only
identifier padid8095667
subject keywordsdensity functional theory
subject keywordselectrochemical electrodes
subject keywordsneural nets
subject keywordsquantum theory
subject keywordssecondary cells
subject keywordsANN techniques
subject keywordsDFT calculations
subject keywordsartificial neural network techniques
subject keywordsdensity functional theory
subject keywordselectrochemical potential
subject keywordshigh voltage Li-ion battery cathode materials
subject keywordslithium ion battery voltage
subject keywordslow time-space complexity
subject keywordsneural network based approach
subject keywordsquantum mechanical calculations
subject keywordsstructure property correlations
subject keywordsArtificial neural networks
subject keywordsBatteries
subject keywordsDiscrete Fourier transforms
subject keywordsElect
identifier doi10.1109/ICDCSyst.2014.6926140
journal titleystem Sciences (HICSS), 2014 47th Hawaii International Conference on
filesize266757
citations0


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