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Table of contents

Year
: 2014
DOI: 10.1109/PVSC.2014.6925078
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/980109
Keyword(s): busbars,elemental semiconductors,finite element analysis,silicon,solar cells,Si,computer finite element analysis,crystalline silicon wafer solar cells,current transport efficiency,differential electroluminescence imaging,local light-induced current,metal busbars,series resistance,Electrical resistance measurement,Fingers,Histograms,Imaging,Photovoltaic cells,Resistance,Silicon,amorphous materials,charge carrier lifetime,photovoltaic cells,silicon
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date accessioned2020-03-12T19:30:37Z
date available2020-03-12T19:30:37Z
date issued2014
identifier other6740362.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/980109?locale-attribute=en
formatgeneral
languageEnglish
titleTable of contents
typeConference Paper
contenttypeMetadata Only
identifier padid8094335
subject keywordsbusbars
subject keywordselemental semiconductors
subject keywordsfinite element analysis
subject keywordssilicon
subject keywordssolar cells
subject keywordsSi
subject keywordscomputer finite element analysis
subject keywordscrystalline silicon wafer solar cells
subject keywordscurrent transport efficiency
subject keywordsdifferential electroluminescence imaging
subject keywordslocal light-induced current
subject keywordsmetal busbars
subject keywordsseries resistance
subject keywordsElectrical resistance measurement
subject keywordsFingers
subject keywordsHistograms
subject keywordsImaging
subject keywordsPhotovoltaic cells
subject keywordsResistance
subject keywordsSilicon
subject keywordsamorphous materials
subject keywordscharge carrier lifetime
subject keywordsphotovoltaic cells
subject keywordssilicon
identifier doi10.1109/PVSC.2014.6925078
journal titlelectronics, Computing and Communication Technologies (IEEE CONECCT), 2014 IEEE International Confere
filesize440096
citations0
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