•  English
    • Persian
    • English
  •   Login
  • Ferdowsi University of Mashhad
  • |
  • Information Center and Central Library
    • Persian
    • English
  • Home
  • Source Types
    • Journal Paper
    • Ebook
    • Conference Paper
    • Standard
    • Protocol
    • Thesis
  • Use Help
View Item 
  •   FUM Digital Library
  • Fum
  • Articles
  • Latin Articles
  • View Item
  •   FUM Digital Library
  • Fum
  • Articles
  • Latin Articles
  • View Item
  • All Fields
  • Title
  • Author
  • Year
  • Publisher
  • Subject
  • Publication Title
  • ISSN
  • DOI
  • ISBN
Advanced Search
JavaScript is disabled for your browser. Some features of this site may not work without it.

Characterization of Intermodulation and Memory Effects Using Offset Multisine Excitation

Author:
Farsi, S.
,
Draxler, Paul J.
,
Gheidi, H.
,
Nauwelaers, Bart K. J. C.
,
Asbeck, P.
,
Schreurs, Dominique
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/TMTT.2014.2302745
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/968609
Keyword(s): intermodulation distortion,nonlinear network synthesis,radiofrequency integrated circuits,transfer functions,in-band distortion measurements,intermodulation products,memory effects characterization,model performance assessment,multisine response,nonlinear circuit characterization,offset multisine excitations,tones frequency offsetting,Computers,Distortion measurement,Frequency measurement,Frequency modulation,Mathematical model,Nonlinear distortion,Peak to average power ratio
Collections :
  • Latin Articles
  • Show Full MetaData Hide Full MetaData
  • Statistics

    Characterization of Intermodulation and Memory Effects Using Offset Multisine Excitation

Show full item record

contributor authorFarsi, S.
contributor authorDraxler, Paul J.
contributor authorGheidi, H.
contributor authorNauwelaers, Bart K. J. C.
contributor authorAsbeck, P.
contributor authorSchreurs, Dominique
date accessioned2020-03-12T18:44:29Z
date available2020-03-12T18:44:29Z
date issued2014
identifier issn0018-9480
identifier other6730722.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/968609?locale-attribute=en
formatgeneral
languageEnglish
publisherIEEE
titleCharacterization of Intermodulation and Memory Effects Using Offset Multisine Excitation
typeJournal Paper
contenttypeMetadata Only
identifier padid8002757
subject keywordsintermodulation distortion
subject keywordsnonlinear network synthesis
subject keywordsradiofrequency integrated circuits
subject keywordstransfer functions
subject keywordsin-band distortion measurements
subject keywordsintermodulation products
subject keywordsmemory effects characterization
subject keywordsmodel performance assessment
subject keywordsmultisine response
subject keywordsnonlinear circuit characterization
subject keywordsoffset multisine excitations
subject keywordstones frequency offsetting
subject keywordsComputers
subject keywordsDistortion measurement
subject keywordsFrequency measurement
subject keywordsFrequency modulation
subject keywordsMathematical model
subject keywordsNonlinear distortion
subject keywordsPeak to average power ratio
identifier doi10.1109/TMTT.2014.2302745
journal titleMicrowave Theory and Techniques, IEEE Transactions on
journal volume62
journal issue3
filesize3302032
citations0
  • About Us
نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
DSpace software copyright © 2019-2022  DuraSpace