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On-Wafer Analog Pulse Generator for Fast Characterization and Parametric Test of Resistive Switching Memories

contributor authorCovi, E.
contributor authorCabrini, Alessandro
contributor authorVendrame, L.
contributor authorBortesi, L.
contributor authorGastaldi, R.
contributor authorTorelli, Guido
date accessioned2020-03-12T18:42:38Z
date available2020-03-12T18:42:38Z
date issued2014
identifier issn0894-6507
identifier other6722889.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/967696?locale-attribute=fa&show=full
formatgeneral
languageEnglish
publisherIEEE
titleOn-Wafer Analog Pulse Generator for Fast Characterization and Parametric Test of Resistive Switching Memories
typeJournal Paper
contenttypeMetadata Only
identifier padid8001708
subject keywordsautomatic test equipment
subject keywordslogic testing
subject keywordsphase change memories
subject keywordsReRAM
subject keywordsautomated test equipment
subject keywordsnonvolatile memories
subject keywordson-wafer analog pulse generator
subject keywordson-wafer pulse generator
subject keywordsphase change memories
subject keywordsresistive switching memories
subject keywordsresistive-RAM
subject keywordstime 50 ns to 350 ns
subject keywordsvoltage 0.5 V to 4.5 V
subject keywordswafer scribe lanes
subject keywordsAccuracy
subject keywordsComputer architecture
subject keywordsMicroprocessors
subject keywordsProgramming
subject keywordsPulse generation
subject keywordsSwitches
subject keywordsTesting
subject keywordsIntegrated circuits
subject keywordsanalog circuits
subject keywordsmemory testing
subject keywordsphase change memory
subject keywordspulse generat
identifier doi10.1109/TSM.2014.2302415
journal titleSemiconductor Manufacturing, IEEE Transactions on
journal volume27
journal issue2
filesize20733320
citations0


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