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A High-Speed and Low-Breakdown-Voltage Silicon Avalanche Photodetector

Author:
Chih-Kuo Tseng
,
Ku-Hung Chen
,
Wei-Ting Chen
,
Lee, Ming-Chang M.
,
Na, Neil
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/LPT.2014.2300853
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/967268
Keyword(s): avalanche breakdown,avalanche photodiodes,laser beams,optical receivers,p-i-n photodiodes,photodetectors,silicon,Si,Zener tunneling process,avalanche breakdown,bandwidth 10 GHz,bit rate 10 Gbit/s,dark current,high-speed optical receiver application,high-speed silicon avalanche photodetector,interdigitated p-i-n junctions,intrinsic bandwidth,intrinsic layer width,laser illumination,low-breakdown-voltage silicon avalanche photodetector,performance degradation,physical limit,r
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    A High-Speed and Low-Breakdown-Voltage Silicon Avalanche Photodetector

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contributor authorChih-Kuo Tseng
contributor authorKu-Hung Chen
contributor authorWei-Ting Chen
contributor authorLee, Ming-Chang M.
contributor authorNa, Neil
date accessioned2020-03-12T18:41:55Z
date available2020-03-12T18:41:55Z
date issued2014
identifier issn1041-1135
identifier other6718022.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/967268
formatgeneral
languageEnglish
publisherIEEE
titleA High-Speed and Low-Breakdown-Voltage Silicon Avalanche Photodetector
typeJournal Paper
contenttypeMetadata Only
identifier padid8001222
subject keywordsavalanche breakdown
subject keywordsavalanche photodiodes
subject keywordslaser beams
subject keywordsoptical receivers
subject keywordsp-i-n photodiodes
subject keywordsphotodetectors
subject keywordssilicon
subject keywordsSi
subject keywordsZener tunneling process
subject keywordsavalanche breakdown
subject keywordsbandwidth 10 GHz
subject keywordsbit rate 10 Gbit/s
subject keywordsdark current
subject keywordshigh-speed optical receiver application
subject keywordshigh-speed silicon avalanche photodetector
subject keywordsinterdigitated p-i-n junctions
subject keywordsintrinsic bandwidth
subject keywordsintrinsic layer width
subject keywordslaser illumination
subject keywordslow-breakdown-voltage silicon avalanche photodetector
subject keywordsperformance degradation
subject keywordsphysical limit
subject keywordsr
identifier doi10.1109/LPT.2014.2300853
journal titlePhotonics Technology Letters, IEEE
journal volume26
journal issue6
filesize798216
citations0
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